Markus Turunen
Yliopistonlehtori
Yliopistonlehtori
T410 Dept. Electrical Engineering and Automation
Full researcher profile
https://research.aalto.fi/...
Research groups
- Microsystems Technology
Publications
Mechanical Analysis of Ultrasound-Activated Pins and Resorbable Screws: Two Different Techniques to Fixate Osteosynthesis in Craniosynostosis Surgery
Mikko Savolainen, Antti Ritvanen, Virpi Koljonen, Markus Turunen, Hanna Hulkkonen, Vesa V Vuorinen, Junnu P Leikola
2015
JOURNAL OF CRANIOFACIAL SURGERY
Interfacial Compatibility in Microelectronics: Away From the Trial and Error Approach
Tomi Laurila, Vesa Vuorinen, Markus Turunen, Toni T. Mattila, Mervi Paulasto-Kröckel, Jorma Kivilahti
2012
A reliability study of adhesion mechanism between liquid crystal polymer and silicone adhesive
Jue Li, Markus Turunen, Sini Niiranen, Hongtao Chen, Mervi Paulasto-Kröckel
2012
Microelectronics Reliability
Hyperelastic Property Measurements of Heat-Cured Silicone Adhesives by Cyclic Uniaxial Tensile Test
Jue Li, Tapio Tarvainen, Jaana Rich, Markus Turunen, Mervi Paulasto-Kröckel
2012
Journal of Electronic Materials
Reactive blending approach to modify spin-coated epoxy film
Markus P.K. Turunen, T. Laurila, J.K. Kivilahti
2006
Journal of Applied Polymer Science
Reactive blending approach to modify spin-coated epoxy film
Markus P.K. Turunen, T. Laurila, J.K. Kivilahti
2006
Journal of Applied Polymer Science
Design and Fabrication of Remote Readable pH-sensor for Biomedical Applications
Markus P.K. Turunen, Ahti Aintila, Jorma Kivilahti
2005
2nd International Workshop on NanoBio-Electronics Packaging, Atlanta, Georgia, USA, 22.-23.March 2005
Evaluation of electrolessly deposited NiP integral resistors on flexible polyimide substrate
Tuomas F. Waris, Markus P.K Turunen, Tomi Laurila, Jorma K. Kivilahti
2005
Microelectronics Reliability
Uudet materiaalit bioadaptiivisessa elektroniikassa
Markus P.K Turunen, Jorma K. Kivilahti
2004
MATERIA
Pull-off test in the assessement of adhesion at printed wiring board metallisation/epoxy interface
Markus P.K Turunen, Pekka Marjamäki, Matti Paajanen, Jouko Lahtinen, Jorma K. Kivilahti
2004
Microelectronics Reliability