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Markus Turunen
Department of Electrical Engineering and Automation

Markus Turunen

University Lecturer

Contact information

Postal address
Rakentajanaukio 2C
Mobile phone
+358505348928
Full researcher profile
https://research.aalto.fi/...

Publications

Department of Electrical Engineering and Automation

Mechanical Analysis of Ultrasound-Activated Pins and Resorbable Screws: Two Different Techniques to Fixate Osteosynthesis in Craniosynostosis Surgery

Publishing year: 2015 JOURNAL OF CRANIOFACIAL SURGERY
Elektroniikan laitos

Interfacial Compatibility in Microelectronics: Away From the Trial and Error Approach

Publishing year: 2012
Elektroniikan laitos

A reliability study of adhesion mechanism between liquid crystal polymer and silicone adhesive

Publishing year: 2012 Microelectronics Reliability
Elektroniikan laitos, Department of Biotechnology and Chemical Technology, Department of Chemical and Metallurgical Engineering

Hyperelastic Property Measurements of Heat-Cured Silicone Adhesives by Cyclic Uniaxial Tensile Test

Publishing year: 2012 Journal of Electronic Materials
Elektroniikan laitos

Reactive blending approach to modify spin-coated epoxy film

Publishing year: 2006 Journal of Applied Polymer Science
Elektroniikan laitos, Department of Electrical Engineering and Automation

Reactive blending approach to modify spin-coated epoxy film

Publishing year: 2006 Journal of Applied Polymer Science
Elektroniikan laitos

Evaluation of electrolessly deposited NiP integral resistors on flexible polyimide substrate

Publishing year: 2005 Microelectronics Reliability
Elektroniikan laitos

Design and Fabrication of Remote Readable pH-sensor for Biomedical Applications

Publishing year: 2005 2nd International Workshop on NanoBio-Electronics Packaging, Atlanta, Georgia, USA, 22.-23.March 2005
Elektroniikan laitos

A new pH-sensor using a polymer layer on an interdigital-capacitor

Publishing year: 2004
Elektroniikan laitos

Determination of Thermal transitions of thin polymeric films from refractive index data

Publishing year: 2004 Microelectronics Reliability