Erkki Ikonen

Professori
Professori
T410 Dept. Electrical Engineering and Automation

Erkki Ikonen received the M. Sc. (Tech.) and the Dr. (Tech.) degrees from the Helsinki University of Technology, Department of Technical Physics, in 1982 and 1988, respectively. Since 1995 he has been Professor of Measurement Science and Technology at Aalto University. This is a joint Professorship with the Finnish National Metrology Institute, VTT Technical Research Centre of Finland Ltd since 2005.

Erkki Ikonen is a Member of the Board of Directors of EURAMET e.V. and Chairman of the European Metrology Programme for Innovation and Research (EMPIR) Committee of EURAMET during 2016-2021. He is also Vice President Technical of the International Commission on Illumination (CIE, Vienna) during the term 2015-2019.

His earlier positions include Assistant Director, Helsinki University of Technology, Department of Electrical and Communications Engineering (1989-95) and Research Scientist, VTT Technical Research Centre of Finland (1988-89).

Erkki Ikonen has chaired international scientific committees of several conferences arranged in Europe, US, Asia, and Australia. He is an author of 190 peer-reviewed scientific publications and over 150 conference papers. His research interests are mainly in the field of optical measurements where he has supervised 35 doctoral degrees at Aalto University.

Full researcher profile
https://research.aalto.fi/...

Publications

Spectral characterization of three wearable electronic ultraviolet radiation dosimeters

Leevi August, Gregor Hülsen, Juha Peltoniemi, Petri Kärhä, Erkki Ikonen 2026 Photochemistry and Photobiology

Application of a bandwidth correction method to thin-film reflectance measurements

Aleksandr Danilenko, Masoud Rastgou, Farshid Manoocheri, Erkki Ikonen 2026 Metrologia

Results of an interlaboratory comparison of adapted reference solar cells among nine metrological institutes

Afsaneh Eghbali Yeldagermani, Petri Kärhä, Erkki Ikonen, Ingo Kröger, Michael Rauer, S. Kasimir Reichmuth, Jochen Hohl-Ebinger, Gabriele Friesen, Flavio Valoti, Giovanni Bellenda, Yean San Long, Min An Tsai, Karsten Bothe, David Hinken, Diego Pavanello, Harald Müllejans, Fatima Mašić, Srđan Čalija, Vladimir Milojević, Ankit Mittal, Marcus Rennhofer, Stefan Winter 2026 Results in Engineering

Improving UV Stability of SiO2/SiNx-Passivated Silicon Photodiodes Through Shallow Junction Implantation and Oxide Regrowth

Michael N. Getz, Ozhan Koybasi, Fredrik Edhborg, Ørnulf Nordseth, Steven Hesse, Tobias Pohl, Marco Povoli, Stefan Källberg, Lutz Werner, Erkki Ikonen, Jarle Gran 2026 Sensors

Characterisation of Complex Multilayer Nanostructures with High Aspect Ratio

Erkki Ikonen, Aleksandr Danilenko, Masoud Rastgou, Farshid Manoocheri, Jussi Kinnunen, Virpi Korpelainen, Antti Lassila 2026 Physica Status Solidi (A) Applications and Materials Science

Characterization of impact ionization rate in silicon over four orders of magnitude

Aarre Kilpeläinen, Meelis Mait Sildoja, Toomas Kübarsepp, Peter Meindl, Tobias Pohl, Lutz Werner, Trinh Tran, Jarle Gran, Farshid Manoocheri, Eivind Bardalen, Erkki Ikonen 2026 AIP Advances

Degradation characterization of induced junction photodiodes under ultraviolet irradiation

Aarre Kilpeläinen, Farshid Manoocheri, Fredrik Edhborg, Stefan Källberg, Ozhan Koybasi, Eivind Bardalen, Lutz Werner, Jarle Gran, Erkki Ikonen 2026 Metrologia

Quantum yield of silicon in the spectral range from ultraviolet to visible

Toomas Kübarsepp, Meelis Mait Sildoja, Jaanus Vahi, Aarre Kilpeläinen, Farshid Manoocheri, Peter Meindl, Tobias Pohl, Lutz Werner, Marek Šmid, Geiland Porrovecchio, Trinh Tran, Jarle Gran, Erkki Ikonen 2026 Metrologia

Comparison of thin-film thickness measurements using ellipsometry and reflectometry with uniform samples

Masoud Rastgou, Deniz Hulagu, Aleksandr Danilenko, Farshid Manoocheri, Andreas Hertwig, Erkki Ikonen 2026 Metrologia

Surface gloss measurement using a gonio-spectrophotometric method

Masoud Rastgou, Farshid Manoocheri, Erkki Ikonen 2026 Journal of Coatings Technology and Research