New HR-TEM installation in progress in Nanomicroscopy Center
A JEOL JEM-2800 high-throughput, high-resolution TEM system is currently being installed to Nanomicroscopy Center.
This versatile TEM features high resolution imaging in TEM, STEM, and SE modes; ultrasensitive elemental mapping with a large angle Energy Dispersive Spectrometer (EDS) for chemical analysis; TEM/STEM tomography; and in situ observation of samples.
The JEM-2800 functions without the use of fluorescent screen. It is operated in a bright room.