Department of Chemistry and Materials Science

Advanced and Functional Materials

Professor Simo-Pekka Hannula's Research Group for Advanced and Functional Materials (AFM) conducts high-quality basic and applied materials research related to both current materials production and new advanced materials. The group is for its part responsible for teaching in materials science bachelor program and in functional materials master’s program.
CHEM_Advanced and functional materials

The group's present areas of research include microstructure and property relationships of functional materials, in particular of:

  1. Complex metal alloys such as magnetic shape memory alloys (MSMAs), radiation resistant high entropy alloys (HEAs) and next generation ferritic-martensitic (F/M) alloys for fission and fusion applications

  2. Composites such as metal-ceramic and ceramic-ceramic composites

  3. Nanomaterials based on titania, alumina, silica, and semiconductors such as CuSbS2

AFM group core knowledge and capabilities are in controlling and characterization of materials microstructure and properties. At the moment AFM group is participating in three different joint projects:

  • THERAD-project funded by the Academy of Finland, where AFM group is responsible of developing new IR filter preparation techniques based on semiconductor-dielectric composites
  • HEAFNA-project initiated by European Energy Research Area (EERA), where AFM group is involved in developing powder based irradiation resistant FeCrNiMn-HEAs
  • M4F-project funded by the EU, where AFM group is responsible for developing nanoindentation techniques for obtaining mechanical properties of irradiated materials based on ball nanoindentation data.

In addition, a company funded project on developing new filter material technologies is carried out.

The main tools used by the group are various microscopy techniques at different scales (i.e., optical microscopy (OM), scanning electron microscopy (SEM) and related analysis (EDS, WDS, EBSD)) and transmission electron microscopy (TEM-STEM, EDS). XRD analyses are used extensively for crystallography. Other characterization techniques used include magnetic measurements (VSM), optical measurements (UV-Vis, IR), nanoindentation (NI) etc.

Research group members

Latest publications

More information on our research in the Research database.
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