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Automated Structure Discovery in Atomic Force Microscopy - Benjamin Alldritt, Prokop Hapala, Niko Oinonen, Fedor Urtev, Ondrej Krejci, Filippo Federici Canova, Juho Kannala, Fabian Schulz, Peter Liljeroth and Adam S. Foster
Computed atomic force microscopy images of chromosomes by calculating forces with oscillating probes - Takashi Sumikama, Adam Foster and Takeshi Fukuma
Elemental Identification by Combining Atomic Force Microscopy and Kelvin Probe Force Microscopy - Fabian Schulz, Juha Ritala, Ondrej Krejci, Ari Paavo Seitsonen, Adam S. Foster and Peter Liljeroth
The weight function for charges -- a rigorous theoretical concept for Kelvin probe force microscopy - Hagen Söngen, Philipp Rahe, Julia L. Neff, Ralf Bechstein, Juha Ritala, Adam S. Foster and Angelika Kühnle
Atom manipulation on an insulator surface at room temperature - Shigeki Kawai, Adam S. Foster, Filippo Federici Canova, Hiroshi Onodeta, Shin-ich Kitamura and Ernst Meyer
Energy loss triggered by atomic-scale lateral force - F. Federici Canova, S. Kawai, C. de Capitani, K. Kan'no, T. Glatzel, B. Such, A. S. Foster and E. Meyer
Measuring electric field induced sub-picometer displacement of step edge ions - Shigeki Kawai, Filippo Federici Canova, Thilo Glatzel, Teemu Hynninen, Ernst Meyer, and Adam S. Foster
Atomic-scale dissipation processes in dynamic force spectroscopy - Shigeki Kawai, Filippo Federici Canova, Thilo Glatzel,Adam S. Foster and Ernst Meyer
Recent Trends in Surface Characterization and Chemistry with High Resolution Scanning Force Methods - C. Barth, A. S. Foster, C. R. Henry and A. L. Shluger
High resolution scanning force microscopy of gold nanoclusters on the KBr (001) surface - O. H. Pakarinen, C. Barth, A. S. Foster, R. M. Nieminen and C. R. Henry
Site-specific force-distance characteristics on the NaCl(001) surface: measurements versus atomistic simulations - M. A. Lantz, R. Hoffmann, A. S. Foster, A. Baratoff, H. J. Hug, H. R. Hidber and H. J.Güntherodt
Measuring site specific cluster-surface interaction - R. Hoffmann, C. Barth, A. S. Foster, A. L. Shluger, H. J. Hug, H. -J. Güntherodt, R. M. Nieminen and M. Reichling
Role of tip and surface relaxation in atomic resolution dynamic force microscopy: CaF2 (111) as a reference surface - Adam S. Foster, Clemens Barth, Alexander L. Shluger, Risto M. Nieminen and Michael Reichling
Contrast Formation in Atomic Resolution Scanning Force Microscopy on CaF2 (111): Experiment and Theory - C. Barth, A. S. Foster, M. Reichling and A. L. Shluger
Atomically Resolved Edges and Kinks of NaCl islands on Cu(111): Experiment and Theory - R. Bennewitz, A. S. Foster, L. N. Kantorovich, M. Bammerlin, Ch. Loppacher, S. Schär, M. Guggisberg, E. Meyer and A. L. Shluger
Investigating the effects of silicon tip contamination in noncontact scanning force microscopy (SFM) - P. V. Sushko, A. S. Foster, L. N. Kantorovich and A. L. Shluger
