SPM

AFM simulations
  • Elemental Identification by Combining Atomic Force Microscopy and Kelvin Probe Force Microscopy - Fabian Schulz, Juha Ritala, Ondrej Krejci, Ari Paavo Seitsonen, Adam S. Foster and Peter Liljeroth 
    • ACS Nano 12 (2018) 5274 [pdf]
  • The weight function for charges -- a rigorous theoretical concept for Kelvin probe force microscopy - Hagen Söngen, Philipp Rahe, Julia L. Neff, Ralf Bechstein, Juha Ritala, Adam S. Foster and Angelika Kühnle 
    • J. Appl. Phys. 119 (2016) 025304 [pdf]
  • Atom manipulation on an insulator surface at room temperature - Shigeki Kawai, Adam S. Foster, Filippo Federici Canova, Hiroshi Onodeta, Shin-ich Kitamura and Ernst Meyer 
    • Nat. Commun. 5 (2014) 4403 [pdf]
  • Energy loss triggered by atomic-scale lateral force - F. Federici Canova, S. Kawai, C. de Capitani, K. Kan'no, T. Glatzel, B. Such, A. S. Foster and E. Meyer 
    • Phys. Rev. Lett. 110 (2013) 203203 [pdf]
  • Defect mediated manipulation of nanoclusters on an insulator - T. Hynninen, G. Cabailh, A. S. Foster, and C. Barth 
    • Sci. Rep. 3 (2013) 1270 [pdf]
  • Measuring electric field induced sub-picometer displacement of step edge ions - Shigeki Kawai, Filippo Federici Canova, Thilo Glatzel, Teemu Hynninen, Ernst Meyer, and Adam S. Foster 
    • Phys. Rev. Lett. 109 (2012) 146101 [pdf]
  • Atomic-scale dissipation processes in dynamic force spectroscopy - Shigeki Kawai, Filippo Federici Canova, Thilo Glatzel,Adam S. Foster and Ernst Meyer 
    • Phys. Rev. B 84 (2011) 115415 [pdf]
  • Recent Trends in Surface Characterization and Chemistry with High Resolution Scanning Force Methods - C. Barth, A. S. Foster, C. R. Henry and A. L. Shluger 
    • Adv. Mater. 23 (2011) 477 [pdf]
  • Polarized tips or surfaces: consequences in Kelvin probe force microscopy - T. Hynninen, C. Barth and Adam S. Foster 
    • e-J. Surf. Sci. Nanotech. 9 (2011) 6 [pdf]
  • Role of the tip in noncontact Atomic Force Microscopy dissipation images of ionic surfaces - Filippo Federici Canova and Adam S. Foster 
    • Nanotechnology 22 (2011) 045702 [pdf]
  • AFM tip characterization by Kelvin probe force microscopy - C. Barth, T. Hynninen, M. Bieletzki, C. R. Henry, A. S. Foster, F. Esch and U. Heiz 
    • N. J. Phys. 12 (2010) 093024 [pdf]
  • Sublattice identification in non-contact atomic force microscopy of the NaCl(001) surface - R. Hoffmann, D. Weiner, A. Schirmeisen and A. S. Foster 
    • Phys. Rev. B 80 (2009) 115426 [pdf]
  • Chemical identification of ions in doped NaCl by scanning force microscopy - Adam S. Foster, Clemens Barth, and Claude R. Henry 
    • Phys. Rev. Lett. 102 (2009) 256103 [pdf]
  • Understanding the atomic-scale contrast in Kelvin Probe Force Microscopy - Laurent Nony, Adam S. Foster, Franck Bocquet and Christian Loppacher 
    • Phys. Rev. Lett. 103 (2009) 036802 [pdf]
  • STM topography and manipulation of single Au atoms on Si(100) - F. Chiaravalloti, D. Riedel, G. Dujardin, H. Pinto and A. S. Foster 
    • Phys. Rev. B 79 (2009) 245431 [pdf]
  • Imaging the real shape of nano-objects in scanning force microscopy - Olli H. Pakarinen, Clemens Barth, Adam S. Foster and Claude R. Henry 
    • J. Appl. Phys. 103 (2008) 054313 [pdf]
  • Imaging nanoclusters in the constant height mode of the dynamic SFM - Clemens Barth, Olli H. Pakarinen, Adam S. Foster and Claude R. Henry 
    • Nanotechnology 17 (2006) S128 [pdf]
  • High resolution scanning force microscopy of gold nanoclusters on the KBr (001) surface - O. H. Pakarinen, C. Barth, A. S. Foster, R. M. Nieminen and C. R. Henry 
    • Phys. Rev. B 73 (2006) 235428 [pdf]
  • Site-specific force-distance characteristics on the NaCl(001) surface: measurements versus atomistic simulations - M. A. Lantz, R. Hoffmann, A. S. Foster, A. Baratoff, H. J. Hug, H. R. Hidber and H. J.Güntherodt 
    • Phys. Rev. B 74 (2006) 245426 [pdf]
  • Simulating dynamic force microscopy imaging of a NaCl island using non-ideal tips - R. Oja and A. S. Foster 
    • Nanotechnology 16 (2005) S7 [pdf]
  • Measuring site specific cluster-surface interaction - R. Hoffmann, C. Barth, A. S. Foster, A. L. Shluger, H. J. Hug, H. -J. Güntherodt, R. M. Nieminen and M. Reichling 
    • J. Am. Chem. Soc. 127 (2005) 17863 [pdf]
  • Realistic model tips in simulations of nc-AFM - A. S. Foster, A. L. Shluger and R. M. Nieminen 
    • Nanotechnology 15 (2004) S60 [pdf]
  • Dependence of the tip-surface interaction on the surface electronic structure - A. S. Foster, A. Y. Gal, Y. J. Lee, A. L. Shluger and R. M. Nieminen 
    • Appl. Surf. Sci. 210 (2003) 146 [pdf]
  • Quantitative modelling in Scanning Force Microscopy on Insulators - Adam S. Foster, Alexander L. Shluger and Risto M. Nieminen 
    • Appl. Surf. Sci. 188 (2002) 306 [pdf]
  • Role of tip and surface relaxation in atomic resolution dynamic force microscopy: CaF2 (111) as a reference surface - Adam S. Foster, Clemens Barth, Alexander L. Shluger, Risto M. Nieminen and Michael Reichling 
    • Phys. Rev. B 66 (2002) 235417 [pdf]
  • Contrast Formation in Atomic Resolution Scanning Force Microscopy on CaF2 (111): Experiment and Theory - C. Barth, A. S. Foster, M. Reichling and A. L. Shluger 
    • J. Phys.: Condens. Matter 13 (2001) 2061 [pdf]
  • Unambiguous interpretation of atomically resolved force microscopy images of an insulator - A. S. Foster, C. Barth, A. L. Shluger and M. Reichling 
    • Phys. Rev. Lett. 86 (2001) 2373 [pdf]
  • Imaging Problems on Insulators: What can be learnt from NC-AFM modelling on CaF2? - A. S. Foster, A. L. Rohl and A. L. Shluger 
    • Appl. Phys. A 72 (2001) S31 [pdf]
  • Tip and Surface Properties from the Distance Dependence of Tip-Surface Interaction - A. S. Foster, L. N. Kantorovich and A. L. Shluger 
    • Appl. Phys. A 72 (2001) S59 [pdf]
  • Spin contrast over Ni ions in Non-contact SFM on the (001) NiO surface: Theoretical Modelling - A. S. Foster and A. L. Shluger 
    • Surf. Sci 490 (2001) 211 [pdf]
  • Atomically Resolved Edges and Kinks of NaCl islands on Cu(111): Experiment and Theory - R. Bennewitz, A. S. Foster, L. N. Kantorovich, M. Bammerlin, Ch. Loppacher, S. Schär, M. Guggisberg, E. Meyer and A. L. Shluger 
    • Phys. Rev. B 62 (2000) 2074 [pdf]
  • Model of noncontact atomic force microscopy on ionic surfaces - A. I. Livshits, A. L. Shluger, A. L. Rohl and A. S. Foster 
    • Phys. Rev. B 59 (1999) 2436 [pdf]
  • Investigating the effects of silicon tip contamination in noncontact scanning force microscopy (SFM) - P. V. Sushko, A. S. Foster, L. N. Kantorovich and A. L. Shluger 
    • Applied Surface Sci. 144 - 145 (1999) 608 [pdf]
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