- Precise atom manipulation through deep reinforcement learning - I-Ju Chen, Markus Aapro, Abraham Kipnis, Alexander Ilin, Peter Liljeroth and Adam S. Foster
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Nat. Commun. 13 (2022) 7499 [pdf]
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- Computed three-dimensional atomic force microscopy images of biopolymers using the Jarzynski equality - Takashi Sumikama, Filippo Federici Canova, David Z. Gao, Adam. S. Foster and Takeshi Fukuma
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J. Phys. Chem. Lett. 13 (2022) 5365 [pdf]
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- Practical considerations for feature assignment in high-speed AFM of live cell membranes - Damien Hall and Adam S. Foster
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Biophysics and Physicobiology 19 (2022) e190016 [pdf]
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- Electrostatic Discovery Atomic Force Microscopy - Niko Oinonen, Chen Xu, Benjamin Alldritt, Prokop Hapala, Filippo Federici Canova, Fedor Urtev, Ondřej Krejčí, Juho Kannala, Peter Liljeroth and Adam S. Foster
- ACS Nano 16 (2022) 89 [pdf]
- Automated Tip Functionalization via Machine Learning in Scanning Probe Microscopy - Benjamin Alldritt, Fedor Urtev, Niko Oinonen, Markus Aapro, Juho Kannala, Peter Liljeroth and Adam S. Foster
- Comp. Phys. Comm. 273 (2022) 108258 [pdf]
- Role of tip apices in scanning force spectroscopy on alkali halides at room temperature - chemical nature of the tip apex and atomic-scale deformations - Philipp Wagner, Adam Foster, Insook Yi, Masayuki Abe, Yoshiaki Sugimoto and Regina Hoffmann-Vogel
- Nanotech. 32 (2020) 035706 [pdf]
- Automated Structure Discovery in Atomic Force Microscopy - Benjamin Alldritt, Prokop Hapala, Niko Oinonen, Fedor Urtev, Ondrej Krejci, Filippo Federici Canova, Juho Kannala, Fabian Schulz, Peter Liljeroth and Adam S. Foster
- Sci. Adv. 6 (2020) eaay6913 [pdf]
- Computed atomic force microscopy images of chromosomes by calculating forces with oscillating probes - Takashi Sumikama, Adam Foster and Takeshi Fukuma
- J. Phys. Chem. C 124 (2020) 2213 [pdf]
- Elemental Identification by Combining Atomic Force Microscopy and Kelvin Probe Force Microscopy - Fabian Schulz, Juha Ritala, Ondrej Krejci, Ari Paavo Seitsonen, Adam S. Foster and Peter Liljeroth
- ACS Nano 12 (2018) 5274 [pdf]
- The weight function for charges -- a rigorous theoretical concept for Kelvin probe force microscopy - Hagen Söngen, Philipp Rahe, Julia L. Neff, Ralf Bechstein, Juha Ritala, Adam S. Foster and Angelika Kühnle
- J. Appl. Phys. 119 (2016) 025304 [pdf]
- Atom manipulation on an insulator surface at room temperature - Shigeki Kawai, Adam S. Foster, Filippo Federici Canova, Hiroshi Onodeta, Shin-ich Kitamura and Ernst Meyer
- Nat. Commun. 5 (2014) 4403 [pdf]
- Energy loss triggered by atomic-scale lateral force - F. Federici Canova, S. Kawai, C. de Capitani, K. Kan'no, T. Glatzel, B. Such, A. S. Foster and E. Meyer
- Phys. Rev. Lett. 110 (2013) 203203 [pdf]
- Defect mediated manipulation of nanoclusters on an insulator - T. Hynninen, G. Cabailh, A. S. Foster, and C. Barth
- Sci. Rep. 3 (2013) 1270 [pdf]
- Measuring electric field induced sub-picometer displacement of step edge ions - Shigeki Kawai, Filippo Federici Canova, Thilo Glatzel, Teemu Hynninen, Ernst Meyer, and Adam S. Foster
- Phys. Rev. Lett. 109 (2012) 146101 [pdf]
- Atomic-scale dissipation processes in dynamic force spectroscopy - Shigeki Kawai, Filippo Federici Canova, Thilo Glatzel,Adam S. Foster and Ernst Meyer
- Phys. Rev. B 84 (2011) 115415 [pdf]
- Recent Trends in Surface Characterization and Chemistry with High Resolution Scanning Force Methods - C. Barth, A. S. Foster, C. R. Henry and A. L. Shluger
- Adv. Mater. 23 (2011) 477 [pdf]
- Polarized tips or surfaces: consequences in Kelvin probe force microscopy - T. Hynninen, C. Barth and Adam S. Foster
- e-J. Surf. Sci. Nanotech. 9 (2011) 6 [pdf]
- Role of the tip in noncontact Atomic Force Microscopy dissipation images of ionic surfaces - Filippo Federici Canova and Adam S. Foster
- Nanotechnology 22 (2011) 045702 [pdf]
- AFM tip characterization by Kelvin probe force microscopy - C. Barth, T. Hynninen, M. Bieletzki, C. R. Henry, A. S. Foster, F. Esch and U. Heiz
- N. J. Phys. 12 (2010) 093024 [pdf]
- Sublattice identification in non-contact atomic force microscopy of the NaCl(001) surface - R. Hoffmann, D. Weiner, A. Schirmeisen and A. S. Foster
- Phys. Rev. B 80 (2009) 115426 [pdf]
- Chemical identification of ions in doped NaCl by scanning force microscopy - Adam S. Foster, Clemens Barth, and Claude R. Henry
- Phys. Rev. Lett. 102 (2009) 256103 [pdf]
- Understanding the atomic-scale contrast in Kelvin Probe Force Microscopy - Laurent Nony, Adam S. Foster, Franck Bocquet and Christian Loppacher
- Phys. Rev. Lett. 103 (2009) 036802 [pdf]
- STM topography and manipulation of single Au atoms on Si(100) - F. Chiaravalloti, D. Riedel, G. Dujardin, H. Pinto and A. S. Foster
- Phys. Rev. B 79 (2009) 245431 [pdf]
- Imaging the real shape of nano-objects in scanning force microscopy - Olli H. Pakarinen, Clemens Barth, Adam S. Foster and Claude R. Henry
- J. Appl. Phys. 103 (2008) 054313 [pdf]
- Imaging nanoclusters in the constant height mode of the dynamic SFM - Clemens Barth, Olli H. Pakarinen, Adam S. Foster and Claude R. Henry
- Nanotechnology 17 (2006) S128 [pdf]
- High resolution scanning force microscopy of gold nanoclusters on the KBr (001) surface - O. H. Pakarinen, C. Barth, A. S. Foster, R. M. Nieminen and C. R. Henry
- Phys. Rev. B 73 (2006) 235428 [pdf]
- Site-specific force-distance characteristics on the NaCl(001) surface: measurements versus atomistic simulations - M. A. Lantz, R. Hoffmann, A. S. Foster, A. Baratoff, H. J. Hug, H. R. Hidber and H. J.Güntherodt
- Phys. Rev. B 74 (2006) 245426 [pdf]
- Simulating dynamic force microscopy imaging of a NaCl island using non-ideal tips - R. Oja and A. S. Foster
- Nanotechnology 16 (2005) S7 [pdf]
- Measuring site specific cluster-surface interaction - R. Hoffmann, C. Barth, A. S. Foster, A. L. Shluger, H. J. Hug, H. -J. Güntherodt, R. M. Nieminen and M. Reichling
- J. Am. Chem. Soc. 127 (2005) 17863 [pdf]
- Realistic model tips in simulations of nc-AFM - A. S. Foster, A. L. Shluger and R. M. Nieminen
- Nanotechnology 15 (2004) S60 [pdf]
- Dependence of the tip-surface interaction on the surface electronic structure - A. S. Foster, A. Y. Gal, Y. J. Lee, A. L. Shluger and R. M. Nieminen
- Appl. Surf. Sci. 210 (2003) 146 [pdf]
- Quantitative modelling in Scanning Force Microscopy on Insulators - Adam S. Foster, Alexander L. Shluger and Risto M. Nieminen
- Appl. Surf. Sci. 188 (2002) 306 [pdf]
- Role of tip and surface relaxation in atomic resolution dynamic force microscopy: CaF2 (111) as a reference surface - Adam S. Foster, Clemens Barth, Alexander L. Shluger, Risto M. Nieminen and Michael Reichling
- Phys. Rev. B 66 (2002) 235417 [pdf]
- Contrast Formation in Atomic Resolution Scanning Force Microscopy on CaF2 (111): Experiment and Theory - C. Barth, A. S. Foster, M. Reichling and A. L. Shluger
- J. Phys.: Condens. Matter 13 (2001) 2061 [pdf]
- Unambiguous interpretation of atomically resolved force microscopy images of an insulator - A. S. Foster, C. Barth, A. L. Shluger and M. Reichling
- Phys. Rev. Lett. 86 (2001) 2373 [pdf]
- Imaging Problems on Insulators: What can be learnt from NC-AFM modelling on CaF2? - A. S. Foster, A. L. Rohl and A. L. Shluger
- Appl. Phys. A 72 (2001) S31 [pdf]
- Tip and Surface Properties from the Distance Dependence of Tip-Surface Interaction - A. S. Foster, L. N. Kantorovich and A. L. Shluger
- Appl. Phys. A 72 (2001) S59 [pdf]
- Spin contrast over Ni ions in Non-contact SFM on the (001) NiO surface: Theoretical Modelling - A. S. Foster and A. L. Shluger
- Surf. Sci 490 (2001) 211 [pdf]
- Atomically Resolved Edges and Kinks of NaCl islands on Cu(111): Experiment and Theory - R. Bennewitz, A. S. Foster, L. N. Kantorovich, M. Bammerlin, Ch. Loppacher, S. Schär, M. Guggisberg, E. Meyer and A. L. Shluger
- Phys. Rev. B 62 (2000) 2074 [pdf]
- Model of noncontact atomic force microscopy on ionic surfaces - A. I. Livshits, A. L. Shluger, A. L. Rohl and A. S. Foster
- Phys. Rev. B 59 (1999) 2436 [pdf]
- Investigating the effects of silicon tip contamination in noncontact scanning force microscopy (SFM) - P. V. Sushko, A. S. Foster, L. N. Kantorovich and A. L. Shluger
- Applied Surface Sci. 144 - 145 (1999) 608 [pdf]
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