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Computed atomic force microscopy images of chromosomes by calculating forces with oscillating probes - Takashi Sumikama, Adam Foster and Takeshi Fukuma
Elemental Identification by Combining Atomic Force Microscopy and Kelvin Probe Force Microscopy - Fabian Schulz, Juha Ritala, Ondrej Krejci, Ari Paavo Seitsonen, Adam S. Foster and Peter Liljeroth
The weight function for charges -- a rigorous theoretical concept for Kelvin probe force microscopy - Hagen Söngen, Philipp Rahe, Julia L. Neff, Ralf Bechstein, Juha Ritala, Adam S. Foster and Angelika Kühnle
Atom manipulation on an insulator surface at room temperature - Shigeki Kawai, Adam S. Foster, Filippo Federici Canova, Hiroshi Onodeta, Shin-ich Kitamura and Ernst Meyer
Energy loss triggered by atomic-scale lateral force - F. Federici Canova, S. Kawai, C. de Capitani, K. Kan'no, T. Glatzel, B. Such, A. S. Foster and E. Meyer
Measuring electric field induced sub-picometer displacement of step edge ions - Shigeki Kawai, Filippo Federici Canova, Thilo Glatzel, Teemu Hynninen, Ernst Meyer, and Adam S. Foster
Atomic-scale dissipation processes in dynamic force spectroscopy - Shigeki Kawai, Filippo Federici Canova, Thilo Glatzel,Adam S. Foster and Ernst Meyer
Recent Trends in Surface Characterization and Chemistry with High Resolution Scanning Force Methods - C. Barth, A. S. Foster, C. R. Henry and A. L. Shluger
High resolution scanning force microscopy of gold nanoclusters on the KBr (001) surface - O. H. Pakarinen, C. Barth, A. S. Foster, R. M. Nieminen and C. R. Henry
Site-specific force-distance characteristics on the NaCl(001) surface: measurements versus atomistic simulations - M. A. Lantz, R. Hoffmann, A. S. Foster, A. Baratoff, H. J. Hug, H. R. Hidber and H. J.Güntherodt
Measuring site specific cluster-surface interaction - R. Hoffmann, C. Barth, A. S. Foster, A. L. Shluger, H. J. Hug, H. -J. Güntherodt, R. M. Nieminen and M. Reichling
Role of tip and surface relaxation in atomic resolution dynamic force microscopy: CaF2 (111) as a reference surface - Adam S. Foster, Clemens Barth, Alexander L. Shluger, Risto M. Nieminen and Michael Reichling
Contrast Formation in Atomic Resolution Scanning Force Microscopy on CaF2 (111): Experiment and Theory - C. Barth, A. S. Foster, M. Reichling and A. L. Shluger
Atomically Resolved Edges and Kinks of NaCl islands on Cu(111): Experiment and Theory - R. Bennewitz, A. S. Foster, L. N. Kantorovich, M. Bammerlin, Ch. Loppacher, S. Schär, M. Guggisberg, E. Meyer and A. L. Shluger
Investigating the effects of silicon tip contamination in noncontact scanning force microscopy (SFM) - P. V. Sushko, A. S. Foster, L. N. Kantorovich and A. L. Shluger
