We use essential cookies to ensure site performance and basic analytics. In addition we use non-essential cookies to serve personalized and targeted content. You may decline or accept these cookies. By continuing to use the site you are agreeing to the use of essential cookies.
.
Cookie settings
Aalto's websites may request cookies to be set on your device. We use cookies to enrich and personalize your user experience. Cookies help us know when you visit our websites, how you interact with us, and what content you view, so we can customize your experience with Acquia, including offering you more relevant content and advertising. You can also change your cookie preferences. Note, that blocking some types of cookies may impact your experience on our websites and the services we are able to offer.
Essential Website Cookies:
These cookies are strictly necessary to provide you with services available through our websites and to use some of its features (such as access to secure areas). Since these cookies are strictly necessary to deliver the websites, you cannot refuse them without impacting your experience and how our websites function. You can block or delete them by changing your browser settings, as described under the heading "How can I control cookies?" in the Cookie Policy.
Non-Essential Website Cookies:
These cookies collect information that is used to help us understand how our websites are being used, how effective our marketing campaigns are, or to help us customize our websites and applications to enhance your experience. You can click below to remove these cookies from your website experience. However, without these cookies, certain functionalities may become unavailable or unusable.
Role of tip apices in scanning force spectroscopy on alkali halides at room temperature - chemical nature of the tip apex and atomic-scale deformations - Philipp Wagner, Adam Foster, Insook Yi, Masayuki Abe, Yoshiaki Sugimoto and Regina Hoffmann-Vogel
Automated Structure Discovery in Atomic Force Microscopy - Benjamin Alldritt, Prokop Hapala, Niko Oinonen, Fedor Urtev, Ondrej Krejci, Filippo Federici Canova, Juho Kannala, Fabian Schulz, Peter Liljeroth and Adam S. Foster
Computed atomic force microscopy images of chromosomes by calculating forces with oscillating probes - Takashi Sumikama, Adam Foster and Takeshi Fukuma
Elemental Identification by Combining Atomic Force Microscopy and Kelvin Probe Force Microscopy - Fabian Schulz, Juha Ritala, Ondrej Krejci, Ari Paavo Seitsonen, Adam S. Foster and Peter Liljeroth
The weight function for charges -- a rigorous theoretical concept for Kelvin probe force microscopy - Hagen Söngen, Philipp Rahe, Julia L. Neff, Ralf Bechstein, Juha Ritala, Adam S. Foster and Angelika Kühnle
Atom manipulation on an insulator surface at room temperature - Shigeki Kawai, Adam S. Foster, Filippo Federici Canova, Hiroshi Onodeta, Shin-ich Kitamura and Ernst Meyer
Energy loss triggered by atomic-scale lateral force - F. Federici Canova, S. Kawai, C. de Capitani, K. Kan'no, T. Glatzel, B. Such, A. S. Foster and E. Meyer
Measuring electric field induced sub-picometer displacement of step edge ions - Shigeki Kawai, Filippo Federici Canova, Thilo Glatzel, Teemu Hynninen, Ernst Meyer, and Adam S. Foster
Atomic-scale dissipation processes in dynamic force spectroscopy - Shigeki Kawai, Filippo Federici Canova, Thilo Glatzel,Adam S. Foster and Ernst Meyer
Recent Trends in Surface Characterization and Chemistry with High Resolution Scanning Force Methods - C. Barth, A. S. Foster, C. R. Henry and A. L. Shluger
High resolution scanning force microscopy of gold nanoclusters on the KBr (001) surface - O. H. Pakarinen, C. Barth, A. S. Foster, R. M. Nieminen and C. R. Henry
Site-specific force-distance characteristics on the NaCl(001) surface: measurements versus atomistic simulations - M. A. Lantz, R. Hoffmann, A. S. Foster, A. Baratoff, H. J. Hug, H. R. Hidber and H. J.Güntherodt
Measuring site specific cluster-surface interaction - R. Hoffmann, C. Barth, A. S. Foster, A. L. Shluger, H. J. Hug, H. -J. Güntherodt, R. M. Nieminen and M. Reichling
Role of tip and surface relaxation in atomic resolution dynamic force microscopy: CaF2 (111) as a reference surface - Adam S. Foster, Clemens Barth, Alexander L. Shluger, Risto M. Nieminen and Michael Reichling
Contrast Formation in Atomic Resolution Scanning Force Microscopy on CaF2 (111): Experiment and Theory - C. Barth, A. S. Foster, M. Reichling and A. L. Shluger
Atomically Resolved Edges and Kinks of NaCl islands on Cu(111): Experiment and Theory - R. Bennewitz, A. S. Foster, L. N. Kantorovich, M. Bammerlin, Ch. Loppacher, S. Schär, M. Guggisberg, E. Meyer and A. L. Shluger
Investigating the effects of silicon tip contamination in noncontact scanning force microscopy (SFM) - P. V. Sushko, A. S. Foster, L. N. Kantorovich and A. L. Shluger
