Department of Applied Physics


Reviews from SIN.
  • Data-driven materials science: status, challenges and perspectives - L. Himanen, A. Geurts, A. S. Foster and P. Rinke
    • Adv. Sci. (2019) 1900808 [pdf
  • Recent Trends in Surface Characterization and Chemistry with High Resolution Scanning Force Methods - C. Barth, A. S. Foster, C. R. Henry and A. L. Shluger 
    • Adv. Mater. 23 (2011) 477 [pdf]
  • An atomistic introduction to anisotropic etching - M. A. Gosálvez, K. Sato, A. S. Foster and R. M. Nieminen 
    • J. Micromech. Microeng. 17 (2007) S1 [pdf]
  • Theories of Scanning Probe Microscopes at the atomic scale - W. Hofer, A. S. Foster and A. L. Shluger 
    • Rev. Mod. Phys. 75 (2003) 1287 [pdf]
  • Quantitative Modelling in Scanning Probe Microscopy - A. S. Foster, W. A. Hofer and A. L. Shluger 
    • Curr. Op. Solid State and Mat. Sci. 5 (2001) 427 [pdf]
  • Models of image contrast in scanning force microscopy on insulators - A. L. Shluger, A. I. Livshits, A. S. Foster and C. R. A. Catlow 
    • J. Phys.: Condens. Matter 11 (1999) R295 [pdf]
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