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Atomic Structure of a Spinel-Like Transition Al2O3(100) Surface - Thomas N. Jensen, Kristoffer Meinander, Stig Helveg, Adam S. Foster, Sampo Kulju, Tiziana Musso and Jeppe V. Lauritsen
A model for a non-volatile memory material: First principles study of Cu diffusion in silicon dioxide - Martin Zeleny, Jozsef Hegedus, Adam S. Foster, David A. Drabold, Stephen R. Elliott and Risto M. Nieminen
Non-contact Atomic Force Microscopy study of hydroxyl groups on the spinel Mg2O4 (100) surface - Filippo F. Canova, Adam S. Foster, Morten K. Rasmussen, Kristoffer Meinander, Flemming Besenbacher and Jeppe V. Lauritsen
on-contact atomic force microscopy imaging of the atomic structure and cation defects of the polar MgAl2O4 (100) surface: Experiments and first principles simulations - Morten K. Rasmussen, Adam S. Foster, Berit Hinnemann, Filippo F. Canova, Stig Helveg, Kristoffer Meinander, Natalia M. Martin, Jan Knudsen, Alina Vlad, Edvin Lundgren, Andreas Stierle, Flemming Besenbacher and Jeppe V. Lauritsen
Stable Cation Inversion at the MgAl2O4 Surface - Morten K. Rasmussen, Adam S. Foster, Berit Hinnemann, Filippo F. Canova, Stig Helveg, Kristoffer Meinander, Natalia M. Martin, Jan Knudsen, Alina Vlad, Edvin Lundgren, Andreas Stierle, Flemming Besenbacher and Jeppe V. Lauritsen
Topography and work function measurements of thin MgO(001) films on Ag(001) by nc-AFM and KPFM - M. Bieletzki, T. Hynninen, T. M. Soin, M. Pivetta, C. R. Henry, A. S. Foster, F. Esch, C. Barth and U. Heiz
Reply to comment on "Imaging of the hydrogen subsurface site in rutile TiO2" - Georg H. Enevoldsen, Henry P. Pinto, Adam S. Foster, Mona C. R. Jensen, Werner A. Hofer, Björk Hammer, Jeppe V. Lauritsen, and Flemming Besenbacher
Imaging of the hydrogen subsurface site in rutile TiO2 - Georg H. Enevoldsen, Henry P. Pinto, Adam S. Foster, Mona C. R. Jensen, Werner A. Hofer, Björk Hammer, Jeppe V. Lauritsen, and Flemming Besenbacher
Role of the tip size and orientation, tip-surface relaxations and surface impurities in simultaneous AFM and STM studies on the TiO2 (110) surface - Henry P. Pinto, Georg H. Enevoldsen, Flemming Besenbacher, Jeppe V. Lauritsen and Adam S. Foster
Detailed scanning probe microscopy tip models determined from simultaneous atom-resolved AFM and STM studies of the TiO2 (110) surface - Georg H. Enevoldsen, Henry Pinto, Adam S. Foster, Mona C. Christensen, Angelika Kühnle, Michael Reichling, W.Hofer, Jeppe V. Lauritsen, and Flemming Besenbacher
Phys. Rev. B 78 (2008) 045416 Editors' suggestion [pdf]
The hydrogen cycle on CeO2 <111> surfaces: Density functional theory calculations - Matthew Watkins, Adam S. Foster and Alexander L. Shluger
Systematic analysis of non-contact atomic force microscopy imaging of vacancies and hydroxyls on the TiO2(110) surface - Georg H. Olesen, Adam S. Foster, Mona C. Christensen, Jeppe V. Lauritsen, and Flemming Besenbacher
Chemical identification of point defects and adsorbates on a metal oxide surface by atomic force microscopy - Jeppe V. Lauritsen, Adam S. Foster, Georg H. Olesen, Mona C. Christensen, Angelika Kühnle, Stig Helveg, Jens R. Rostrup-Nielsen, Bjerne S. Clausen, Michael Reichling and Flemming Besenbacher
Interfacial oxide growth in silicon/high-k oxide interfaces: first principles modelling of the Si-HfO2interface - M. H. Hakala, A. S. Foster, J. L. Gavartin, P. Havu, M. J. Puska and R. M. Nieminen
Experimental Humidity Dependency of Small Particle Adhesion on Silica and Titania - Matti Paajanen, Jukka Katainen, Olli H Pakarinen, Adam S Foster and Jouko Lahtinen
Interfacial oxide growth in silicon/high-k oxide interfaces: first principles modelling of the Si-HfO2interface - M. H. Hakala, A. S. Foster and R. M. Nieminen
Mat. Sci. Semi. Proc. 9 (2006) 928
The role of nitrogen related defects in high-k dielectric oxides: density functional studies - J. L. Gavartin, A. S. Foster, G. I. Bersuker, A. L. Shluger and R. M. Nieminen
Adsorption of atomic and molecular oxygen on Cu(100) - A. Puisto, H. Pitkänen, M. Alatalo, S. Jaatinen, P. Salo, A. S. Foster, T. Kangas and K. Laasonen
Simulating atomic force microscopy imaging of the ideal and defected TiO2 (110) surface - A. S. Foster, O. H. Pakarinen, J. M. Airaksinen, J. D. Gale and R. M. Nieminen
Towards chemical identification in atomic resolution NC-AFM imaging with silicon tips - A. S. Foster, A. Y. Gal, J. M. Airaksinen, O. H. Pakarinen, Y. J. Lee, J. D. Gale, A. L. Shluger and R. M. Nieminen
