Books

Books
  • Ch. 18 'Simulating Solid-Liquid Interfaces in Atomic Force Microscopy' Bernhard Reischl, Filippo Federici Canova, Peter Spijker, Matt Watkins and Adam S. Foster in 'Noncontact atomic force microscopy III' S. Morita, F. Giessibl, E. Meyer and R. Weisendanger eds. Springer, Berlin (2015)
  • Ch. 5 'Contribution of the Numerical Approach to Kelvin Probe Force Microscopy on the Atomic-Scale' Laurent Nony, Franck Bocquet, Adam S. Foster, and Christian Loppacher in 'Kelvin Probe Force Microscopy: Measuring and Compensating Electrostatic Forces' Sascha Sadewasser and Thilo Glatzel eds. Springer Series in Surface Sciences 48 (2012)
  • 'Scanning Probe Microscopes: Atomic scale engineering by forces and currents' Adam S. Foster and Werner A. Hofer Springer, New York (2006)
  • Ch. 16 'The magnetic nature of intrinsic and irradiation-induced defects in carbon systems' P. O. Lehtinen, A. V. Krasheninnikov, A. S. Foster and R. M. Nieminen in 'Carbon-Based Magnetism T. Makarova and F. Palacio eds. Elsevier, North-Holland (2006) 
  • Ch. 4.1 'Defects and defect-controlled behaviour in high-k materials: a theoretical perspective' Marshall Stoneham, Alexander Shluger, Adam Foster and Marek Szymanski in 'High k Gate Dielectrics' M. Houssa ed. IOP, London (2003)
  • Ch. 5 'Defects in wide-gap oxides: Computer modelling and challenges' A. L. Shluger, A. S. Foster, J. L. Gavartin and P. V. Sushko in 'Nano and giga challenges in microelectronics' J. Greer, A. Korkin and J. Labanowski eds. Elsevier, North-Holland (2003) 
  • Ch. 17 'Contrast mechanisms on insulating surfaces' A. S. Foster, A. L. Shluger, C. Barth and M. Reichling in 'Noncontact atomic force microscopy' S. Morita, R. Weisendanger and E. Meyer eds.Springer, Berlin (2002)
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