xDReflect project (2014-2017)

Metrology Research Institute is involved in European Metrology Research Programme (EMRP) project xDReflect - "Multidimensional reflectometry for industry".
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The project aimed to validate reliable optical measurements with traceability to the SI-system to describe the overall macroscopic appearances of modern surfaces. 

Metrology Research Institute contributed in WP1 and WP3. The contribution in WP1 task 1, "Improvement of the traceability of measurements for standard geometries", was by providing traceable measurements of diffuse reflectance using its gonioreflectometer facility. Metrology Research Institute led the WP3, "Fluorescence transfer standard materials" and participated in all tasks. The contribution was based on competence in the area of diffuse reflectance measurements of fluorescence materials and development of a unique goniofluorometer facility. Metrology Research Institute provided multi-angular diffuse reflectance measurements and characterisation of candidate test samples in the 280 nm – 830 nm wavelength range.

Contact person: Farshid Manoocheri

 

More information about the project can be found at the project website:

https://www.xdreflect.eu

References:

[1] P. Jaanson, F. Manoocheri, and E. Ikonen, "Goniometrical measurements of fluorescence quantum efficiency," Meas. Sci. Technol. 27, 025204 (2016).

[2] P. Jaanson, F. Manoocheri, H. Mäntynen, M. Gergely, J.-L.Widlowski, and E. Ikonen, "Gonioreflectometric properties of metal surfaces," Metrologia 51, S314–S318 (2014).

[3] S. Holopainen, F. Manoocheri, and E. Ikonen "Non-Lambertian behaviour of fluorescence emission from solid amorphous material," Metrologia 46, S197–S201 (2009).

[4] S. Holopainen, F. Manoocheri, and E. Ikonen, "Goniofluorometer for characterization of fluorescent materials," Appl. Opt. 47, 835–842 (2008).

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