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Kap. 5 'Contribution of the Numerical Approach to Kelvin Probe Force Microscopy on the Atomic-Scale' Laurent Nony, Franck Bocquet, Adam S. Foster, and Christian Loppacher in 'Kelvin Probe Force Microscopy: Measuring and Compensating Electrostatic Forces' Sascha Sadewasser and Thilo Glatzel eds. Springer Series in Surface Sciences 48 (2012)


Recent Trends in Surface Characterization and Chemistry with High Resolution Scanning Force Methods - C. Barth, A. S. Foster, C. R. Henry and A. L. Shluger 

  • Adv. Mater. 23 (2011) 477:
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