Farshid Manoocheri
Staff Scientist
Staff Scientist
T410 Dept. Electrical Engineering and Automation
Full researcher profile
https://research.aalto.fi/...
Sähköposti
farshid.manoocheri@aalto.fi
Puhelinnumero
+358505902483
Tutkimusryhmät
- Metrology Research Institute, Staff Scientist
Julkaisut
Application of a bandwidth correction method to thin-film reflectance measurements
Aleksandr Danilenko, Masoud Rastgou, Farshid Manoocheri, Erkki Ikonen
2026
Metrologia
Comparison of thin-film thickness measurements using ellipsometry and reflectometry with uniform samples
Masoud Rastgou, Deniz Hulagu, Aleksandr Danilenko, Farshid Manoocheri, Andreas Hertwig, Erkki Ikonen
2026
Metrologia
Emissivity and Reflectivity Measurements for Passive Radiative Cooling Technologies
A. Adibekyan, J. Schumacher, L. Pattelli, J. Manara, S. Meriç, C. Cucchi, C. Sprengard, G. Pérez, J. Campos, J. Hameury, A. Andersson, S. Clausen, C. Belotti, S. Efthymiou, M. N. Assimakopoulos, D. Papadaki, F. Manoocheri, A. Llados, J. Jaramillo-Fernandez, T. Gionfini, M. Ortisi, A. Peter, M. Kleinbub, J. Bante, L. Donath, H. Herzog, C. Monte
2025
International Journal of Thermophysics
Reflectometry technique for study of complex multilayer micro- and nanostructures with lateral periodicity
Aleksandr Danilenko, Masoud Rastgou, Farshid Manoocheri, Jussi Kinnunen, Virpi Korpelainen, Antti Lassila, Erkki Ikonen
2025
Journal of Applied Physics
An SI-traceable protocol for the validation of radiative transfer model-based reflectance simulation
Vincent Leroy, Robin Aschan, Peter Woolliams, Sebastian Schunke, Farshid Manoocheri, Yves Govaerts
2025
IEEE Transactions on Geoscience and Remote Sensing
Selection and Preliminary Measurements of Optical Absorbance Liquid Filters as Reference Materials
Liudmyla Petrushchenko, Michal Mariassy, Farshid Manoocheri, Natalia Parkhomenko, Yelizaveta Tarasenko, Yasaman Rezazadeh, Peter Pavlasek
2025
2025 Proceedings of the 15th International Conference on Measurement, MEASUREMENT 2025
Optimizing measurement accuracy in microscope-based reflectometry for thin film optical properties
Masoud Rastgou, Aleksandr Danilenko, Juha Peltoniemi, Farshid Manoocheri, Erkki Ikonen
2025
Measurement Science and Technology
Surface gloss measurement using a gonio-spectrophotometric method
Masoud Rastgou, Farshid Manoocheri, Erkki Ikonen
2025
Journal of Coatings Technology and Research
Considerations on measurement of bidirectional transmittance distribution function of thick samples over a wide range of viewing zenith angles
Robin Aschan, Farshid Manoocheri, Erkki Ikonen
2024
Measurement Science and Technology
Measurement of bidirectional transmittance distribution function in the visible and near-infrared spectral range
Robin Aschan, Farshid Manoocheri, Dmitri Lanevski, Erkki Ikonen
2024
Metrologia