Aarre Kilpeläinen

Doctoral Researcher
Doctoral Researcher
T410 Dept. Electrical Engineering and Automation
Full researcher profile
https://research.aalto.fi/...

Tutkimusryhmät

  • Metrology Research Institute, Doctoral Researcher

Julkaisut

Degradation characterization of induced junction photodiodes under ultraviolet irradiation

Aarre Kilpeläinen, Farshid Manoocheri, Fredrik Edhborg, Stefan Källberg, Ozhan Koybasi, Eivind Bardalen, Lutz Werner, Jarle Gran, Erkki Ikonen 2026 Metrologia