Aarre Kilpeläinen
Doctoral Researcher
Doctoral Researcher
T410 Dept. Electrical Engineering and Automation
Full researcher profile
https://research.aalto.fi/...
Sähköposti
aarre.kilpelainen@aalto.fi
Tutkimusryhmät
- Metrology Research Institute, Doctoral Researcher
Julkaisut
Characterization of impact ionization rate in silicon over four orders of magnitude
Aarre Kilpeläinen, Meelis Mait Sildoja, Toomas Kübarsepp, Peter Meindl, Tobias Pohl, Lutz Werner, Trinh Tran, Jarle Gran, Farshid Manoocheri, Eivind Bardalen, Erkki Ikonen
2026
AIP Advances
Degradation characterization of induced junction photodiodes under ultraviolet irradiation
Aarre Kilpeläinen, Farshid Manoocheri, Fredrik Edhborg, Stefan Källberg, Ozhan Koybasi, Eivind Bardalen, Lutz Werner, Jarle Gran, Erkki Ikonen
2026
Metrologia
Quantum yield of silicon in the spectral range from ultraviolet to visible
Toomas Kübarsepp, Meelis Mait Sildoja, Jaanus Vahi, Aarre Kilpeläinen, Farshid Manoocheri, Peter Meindl, Tobias Pohl, Lutz Werner, Marek Šmid, Geiland Porrovecchio, Trinh Tran, Jarle Gran, Erkki Ikonen
2026
Metrologia