Masoud Rastgou
Project Employee
Project Employee
T314 Dept. Neuroscience and Biomedical Engineering
Full researcher profile
https://research.aalto.fi/...
Sähköposti
masoud.rastgou@aalto.fi
Puhelinnumero
+358504066204
Julkaisut
Application of a bandwidth correction method to thin-film reflectance measurements
Aleksandr Danilenko, Masoud Rastgou, Farshid Manoocheri, Erkki Ikonen
2026
Metrologia
Characterisation of Complex Multilayer Nanostructures with High Aspect Ratio
Erkki Ikonen, Aleksandr Danilenko, Masoud Rastgou, Farshid Manoocheri, Jussi Kinnunen, Virpi Korpelainen, Antti Lassila
2026
Physica Status Solidi (A) Applications and Materials Science
Comparison of thin-film thickness measurements using ellipsometry and reflectometry with uniform samples
Masoud Rastgou, Deniz Hulagu, Aleksandr Danilenko, Farshid Manoocheri, Andreas Hertwig, Erkki Ikonen
2026
Metrologia
Surface gloss measurement using a gonio-spectrophotometric method
Masoud Rastgou, Farshid Manoocheri, Erkki Ikonen
2026
Journal of Coatings Technology and Research
Reflectometry technique for study of complex multilayer micro- and nanostructures with lateral periodicity
Aleksandr Danilenko, Masoud Rastgou, Farshid Manoocheri, Jussi Kinnunen, Virpi Korpelainen, Antti Lassila, Erkki Ikonen
2025
Journal of Applied Physics
Advancements in optical metrology for gloss and thin-film characterization
Masoud Rastgou
2025
Optimizing measurement accuracy in microscope-based reflectometry for thin film optical properties
Masoud Rastgou, Aleksandr Danilenko, Juha Peltoniemi, Farshid Manoocheri, Erkki Ikonen
2025
Measurement Science and Technology
Characterization of PillarHall test chip structures using a reflectometry technique
Aleksandr Danilenko, Masoud Rastgou, Farshid Manoocheri, Jussi Kinnunen, Virpi Korpelainen, Antti Lassila, Erkki Ikonen
2023
Measurement Science and Technology