Kalle Kinnunen
Doctoral Researcher
Doctoral Researcher
T212 Department of Energy and Mechanical Engineering
Full researcher profile
https://research.aalto.fi/...
Sähköposti
kalle.kinnunen@aalto.fi
Puhelinnumero
+358504795054
Tutkimusryhmät
- Mechatronics, Doctoral Researcher
Julkaisut
Electrical Runout Caused by Microstructure Variations Relative to Shaft Diameter Changes
Veeti Karhu, Kalle Kinnunen, Raine Viitala
2026
I2MTC 2026 - 2026 IEEE International Instrumentation and Measurement Technology Conference, Conference Proceedings
Correlations Between Eddy Current Probe Responses and Areal Surface Roughness Parameters
Kalle Kinnunen, Raine Viitala
2026
IEEE/ASME Transactions on Mechatronics
Eddy Current Probe Impedance Response to Residual Stress and Small-Scale Surface Roughness Variations
Kalle Kinnunen, Raine Viitala
2026
IEEE/ASME Transactions on Mechatronics
Eddy current sensor-based direct tool condition monitoring in milling
Kalle Kinnunen, Raine Viitala
2026
Measurement
Influence of Absolute Eddy Current Probe Size on Surface Roughness Sensitivity
Kalle Kinnunen, Raine Viitala
2026
IEEE Transactions on Instrumentation and Measurement
Review on Causes and Mitigation of Electrical Runout
Kalle Kinnunen, Veeti Karhu, Raine Viitala
2026
Proceedings of the 12th IFToMM International Conference on Rotordynamics - Volume 1
Tool Condition Monitoring from Workpiece Surface Using an Eddy Current Probe
Kalle Kinnunen, Raine Viitala
2026
IEEE Sensors Journal
Tool wear characterization using a custom multi-frequency eddy current probe
Kalle Kinnunen, Raine Viitala
2026
IEEE Transactions on Instrumentation and Measurement
Effect of diamond burnishing treatment parameters on eddy current displacement measurement
Veeti Karhu, Kalle Kinnunen, Raine Viitala
2025
IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2025 - Proceedings
Tool Condition Monitoring of Turning Inserts Using an Eddy Current Sensor
Kalle Kinnunen, Raine Viitala
2025
IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2025 - Proceedings