Joonas Leppänen
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T410 Dept. Electrical Engineering and Automation
Full researcher profile
https://research.aalto.fi/...
Julkaisut
Aluminium corrosion in power semiconductor devices
J. Leppänen, J. Ingman, J. H. Peters, M. Hanf, R. Ross, G. Koopmans, J. Jormanainen, A. Forsström, G. Ross, N. Kaminski, V. Vuorinen
2022
Microelectronics Reliability
A humidity-induced novel failure mechanism in power semiconductor diodes
J. Leppänen, G. Ross, V. Vuorinen, J. Ingman, J. Jormanainen, M. Paulasto-Kröckel
2021
Microelectronics Reliability