Zeiss Sigma VP

Zeiss Sigma VP Information Card

Manufacturer

Zeiss

Model

Sigma VP

Emitter

Schottky FEG

Installation

2012

Detectors

In-column SE
ETSE
BSE (5 segment)
VPSE
STEM

Resolution

1.3 nm @ 20 kV
2.8 nm @ 1 kV
2.5 nm @ 30 kV (VPSE)

Acceleration voltage

0.1 - 30 kV

Probe current

4 pA - 20 nA

Operating modes

High vacuum (10-5 Pa)
Variable pressure (2-133 Pa, N2)

Stage

Motorized 5 axis (compucentric)
X & Y 125 mm
Z 50 mm
T 0 - 90°
R 360°

Specimen size

max. 250 mm diameter
max. 145 mm height

Contact

[email protected]
[email protected]

Pricing

See the current fees.

Availability

The instrument is available for outside users, such as other departments, universities, VTT, and industry.
It is also possible to buy imaging service.
Contact Prof. Janne Ruokolainen for details.

Photos and micrographs

Carbon nanotube film
Imaged in Scandem 2011 by Zeiss
Sample from M.Sc. Antti Kaskela

Nanocellulose fibrils (no coating)
Imaged in Scandem 2011 by Zeiss
Sample from M.Sc. Juuso Korhonen

STEM dark-field
15 nm diameter nanoparticles on carbon.
Imaged in STEM DF mode
Sample courtesy of M.Sc. Jukka Hassinen

This service is provided by:

Nanomicroscopy Center

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