Raw materials - Structural analysis

XRD's

Powder X-ray diffractometers with Anton Paar reaction chamber and GIXRD+XRR for thin film analysis

Panalytical X'pert ProMPD and Panalytical X'pert Pro/PW 3040/60

MPD: Powder X-ray diffraction and Anton Paar reaction chamber: possibility for high-temperature measurements (1200 C) in selected atmosphere (oxygen, air, nitrogen).

PW3040: GIXRD and XRR for thin film characterization

PW3040: GIXRD and XRR for thin film characterization

UPLC/MS

Waters Acquity UPLC (2996 PDA Detector) with Micromass LCT Premier MS

Waters Acquity UPLC (2996 PDA Detector) with Micromass LCT Premier MS

Polarimeter

PerkinElmer Polarimeter 343

Contact person: Senior Laboratory Technician Tiia Juhala (@aalto.fi)

 

PerkinElmer Polarimeter 343

Scanning electron microscopes (SEM)

Tescan Mira-3 (SEM+EDS+WDS+EBSD+tensile testing)

Tescan Mira-3 (SEM+EDS+WDS+EBSD+tensile testing)

LEO 1450 (SEM+EDS+WDS)

LEO 1450 (SEM+EDS+WDS)

Hitachi TM-1000 – Table top with lower vacuum

Hitachi TM-1000 –Table top with lower vacuum

Transmission electron microscope (TEM)

Technai F20 G2 200kV FEG S-Twin + EDS + Gatan GI

Located at the Nanomicroscopy center. Contact person: Yanling Ge (@aalto.fi)

Technai F20 G2 200kV FEG S-Twin + EDS + Gatan GI
This service is provided by:

Raw materials research infrastructure

Did you find what you were looking for? If not, please contact us.
  • Published:
  • Updated:
Share
URL copied!