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Analytical high-resolution SEM: JEOL JSM-7500FA

Instructions

Download instructions from the links below:

    JEOL JSM-7500FA Information Card

    Manufacturer

    JEOL

    Model

    JSM-7500FA

    Emitter

    Cold FEG

    Installation

    2008

    Detectors

    In-column SE
    ETSE
    BSE (2 segment)
    EDX (JEOL)

    Resolution

    0.6 nm @ 30 kV
    1.4 nm @ 1 kV

    Acceleration voltage

    0.1 - 30 kV

    Probe current

    -

    Operating modes

    High vacuum (10-5 Pa)

    Stage

    Motorized 5 axis
    X & Y 50 mm
    Z 25 mm
    R 360°
    T -5 - 70°

    Specimen size

    max. 100 mm diameter (movement limit 50 mm)
    max. 10 mm height

    Contact

    [email protected]
    [email protected]

    Pricing

    See the current fees.

    Availability

    The instrument is available for outside users, such as other departments, universities, VTT, and industry.
    It is also possible to buy imaging service.
    Contact Prof. Janne Ruokolainen for details.

    Photos and micrographs

    JEOL JSM-7500FA installed in NMC

    SEM sample chamber

    Multi-walled carbon nanotubes
    + catalyst Fe particles
    Sample by M.Sc. Antti Kaskela
    Operator M.Sc. Juuso Korhonen

    Nanocellulose fibrils (no coating)
    Micrograph by M.Sc. Juuso Korhonen

    Au nanoparticles on carbon
    2 kV Gentle Beam mode
    Magnification 500 000
    Image taken by JEOL at NMC

    Au nanoparticles on carbon
    1 kV Gentle Beam mode
    Magnification 500 000
    Image taken by JEOL at NMC

    Au nanoparticles on carbon
    500 V
    Magnification 500 000
    Image taken by JEOL at NMC

    Au nanoparticles on carbon
    100 V
    Magnification 500 000
    Image taken by JEOL at NMC

    This service is provided by:

    Nanomicroscopy Center

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