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Aalto Electronics-ICT - Antenna Characterization

The antenna characterization facilities consists of four main sections:

Anechoic chamber

The anechoic chamber contains instrumentation for 2 – 60 GHz far-field and 18 – 60 GHz spherical near-field antenna measurements. The measurement distance is 5.5 m and the enclosure is shielded up to 18 GHz. The measurement instrumentation includes a 67 GHz network analyzer (Keysight N5227A).

Near-field scanner

The near-field scanner is mainly used for high gain millimetre and sub-millimetre antenna characterization. Main instruments of the system are:

  • 1.5 m x 1.5 m planar near-field scanner (Near-Field Systems NSI-200V-5X5)
  • Antenna range controller (Near-Field Systems Series A Controller)
  • 50 GHz four-port vector network analyzer (Keysight N5225A PNA)
  • 50 GHz - 1.1 THz mm-wave modules (VDI VNAX extension modules WR15+ to WR1.0)

StarLab

StarLab by Microwave Vision Group is a compact near-field antenna measurement system for fast characterization of low frequency antennas up to 45 cm in diameter. The StarLab system at Aalto Electronics-ICT includes:

  • Spherical measurement geometry
  • 650 MHz - 6 GHz frequency range
  • Software suite for passive antenna measurements
  • Two movable walls of absorbers
  • Standard gain horn antennas
  • 6 GHz vector network analyzer (Keysight E5071C ENA)

Workshop

The workshop has metal working machines and hand tools for mechanical prototyping and antenna fabrication. The workshop serves the whole Aalto Electronics-ICT infra.

This service is provided by:

Department of Electronics and Nanoengineering

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